江苏科技信息 ›› 2016, Vol. 33 ›› Issue (8): 33-34.doi: 10.3969/j.issn.1004-7530.2016.08.020
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刘春梅, 曹文
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Liu Chunmei, Cao Wen
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摘要： 文章采用AT89S52单片机作为主控芯片，设计了一种能够对常用的TTL和CMOS集成器件进行测试的数字集成器件测试仪，该仪器可实现对已知型号的集成器件质量测定以及对未知型号器件的功能识别；测试结果用LCD液晶模块显示；同时系统还设计有完善的上位机系统，PC机可通过RS232串口对测试系统的数据库进行升级。
关键词: AT89S52, 数字集成器件, 芯片检测, 上位机
Abstract: This paper uses AT89S52 microcontroller as the main control chip, and designs digital integrated circuit test system to detect the TTL and CMOS digital IC in common use. The instrument can test quality of known types of IC chips and identify the function of unknown chips. The result of detection can be displayed on LCD module. And the system includes perfect software of host computer. The PC can upgrade the database of the system through RS232 serial communication port.
刘春梅, 曹文. 数字集成器件测试仪的研制与设计[J]. 江苏科技信息, 2016, 33(8): 33-34.
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链接本文: https://qkcb.jssti.cn/jskj/CN/10.3969/j.issn.1004-7530.2016.08.020
https://qkcb.jssti.cn/jskj/CN/Y2016/V33/I8/33
